US Patent 7499808 - Characterizing nanoparticles in gunshot residue
http://www.freepatentsonline.com/7499808.html
Conventional methods for gunshot residue analysis can produce inaccurate results for close range firing and can require a relatively large sample size. This patent teaches a method based on scanning electron microscopy for nanoparticulate analysis of the residue to improve the accuracy of forensic results with a smaller sample. Claim 1 reads:
1. A method for analyzing gun-shot residue, the method comprising:
determining a size of at least one nanoparticle from the gun shot residue using a measurement system, wherein the size corresponds to a weapon caliber; and
computing a temperature of formation of the at least one nanoparticle based on the size of the at least one nanoparticle using an analysis application, wherein the temperature of formation corresponds to a firing distance, wherein the weapon caliber and firing distance are useful in forensic studies.
Conventional methods for gunshot residue analysis can produce inaccurate results for close range firing and can require a relatively large sample size. This patent teaches a method based on scanning electron microscopy for nanoparticulate analysis of the residue to improve the accuracy of forensic results with a smaller sample. Claim 1 reads:
1. A method for analyzing gun-shot residue, the method comprising:
determining a size of at least one nanoparticle from the gun shot residue using a measurement system, wherein the size corresponds to a weapon caliber; and
computing a temperature of formation of the at least one nanoparticle based on the size of the at least one nanoparticle using an analysis application, wherein the temperature of formation corresponds to a firing distance, wherein the weapon caliber and firing distance are useful in forensic studies.
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