US Patent 7847273 - CNT electron gun with alignment mechanism

http://www.freepatentsonline.com/7847273.html

Electron guns typically require a positively charged electrode to facilitate electron extraction but any misalignment between the electron source and extractor can cause focusing problems. This patent from ELORET Corporation teaches a carbon nanotube electron emitter which includes alignment features. Claim 1 reads:

1. An electron source comprising:

a substrate;

a conductive material disposed on said substrate;

a carbon nanotube coupled to said conductive material; and

wherein said substrate comprises a first feature operable to interface with an extractor of an electron gun, and wherein said first feature is further operable to position said carbon nanotube with respect to said extractor.

US Patent 7628972 - Shaping nanostructures with ion flux

http://www.freepatentsonline.com/7628972.html

Focused ion beam processing is a common technique used to shape materials on the nanoscale. This patent from Eloret Corporation teaches a method of bending or aligning carbon nanotubes using a focused ion beam. Claim 1 reads:

1. A method for molding a nanostructure into a desired configuration comprising: applying an ion flux from an ion source to a nanostructure, wherein the direction of said ion flux with respect to said nanostructure causes said nanostructure to bend in the direction of said ion source.

However, one prior art patent which appears to have been overlooked is US Patent 6,248,674 from HP which also teaches alignment of nanowires on a substrate using ionic flux.