US Patent 7932189 - Fabrication of silicon nanocrystal memory cell
http://www.freepatentsonline.com/7932189.html
Nanocrystal films can play an important role in enhancing the reliability of nanoscale floating gate memory cells. This patent from Freescale Semiconductor teaches a fabrication method for such films. Claim 1 reads:
1. A process of forming an electronic device comprising:
forming a first layer of discontinuous storage elements over a dielectric layer, wherein: the discontinuous storage elements have an average diameter of approximately 2 to approximately 20 nm; and
at least some of the discontinuous storage elements are silicon nanocrystals;
forming a second layer over the discontinuous storage elements and substantially all of the dielectric layer, wherein the second layer is a silicon layer having a thickness in a range of approximately 3 to approximately 9 nm;
oxidizing substantially all of the second layer; and
forming a gate electrode after oxidizing substantially all of the second layer, wherein the electronic device includes a memory cell comprising a set of the discontinuous storage elements and the gate electrode.
Nanocrystal films can play an important role in enhancing the reliability of nanoscale floating gate memory cells. This patent from Freescale Semiconductor teaches a fabrication method for such films. Claim 1 reads:
1. A process of forming an electronic device comprising:
forming a first layer of discontinuous storage elements over a dielectric layer, wherein: the discontinuous storage elements have an average diameter of approximately 2 to approximately 20 nm; and
at least some of the discontinuous storage elements are silicon nanocrystals;
forming a second layer over the discontinuous storage elements and substantially all of the dielectric layer, wherein the second layer is a silicon layer having a thickness in a range of approximately 3 to approximately 9 nm;
oxidizing substantially all of the second layer; and
forming a gate electrode after oxidizing substantially all of the second layer, wherein the electronic device includes a memory cell comprising a set of the discontinuous storage elements and the gate electrode.
Labels: Freescale Semiconductor
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