Monday, October 18, 2010

US Patent 7814565 - Nanostructure on a probe tip

The use of carbon nanotube tips in atomic force microscopes has been shown to increase the resolution and inspection capability of high aspect ratio structures. This patent discloses a manufacturing technique which may improve the adhesion strength of nanotube tips on AFMs. Claim 1 reads:

1. A method for forming a nanostructure on a probe tip, comprising:

providing a substrate on which a plurality of nanostructures are formed;

contacting a probe tip with at least one of the nanostructures, the probe tip having a surface layer, wherein the probe is metal;

melting at least a portion of the surface layer to attach the at least one nanostructure to the probe tip; and

releasing the at least one nanostructure from the substrate.