US Patent 7446053 - Multilayer nanocomposite capacitor
http://www.freepatentsonline.com/7446053.html
This patent from Hynix Semiconductor teaches forming a capacitor using a ZrO2/TiO2 multilayer nanocomposite material as the dielectric to reduce leakage current in highly integrated semiconductor devices. Claim 1 reads:
1. A method for fabricating a capacitor, comprising:
forming a lower electrode; forming a nano-composite layer over the lower electrode by mixing X number of different sub-layers, where X is a positive integer greater than approximately 1;
densifying the nano-composite layer; and
forming an upper electrode layer over the nano-composite layer.
This patent from Hynix Semiconductor teaches forming a capacitor using a ZrO2/TiO2 multilayer nanocomposite material as the dielectric to reduce leakage current in highly integrated semiconductor devices. Claim 1 reads:
1. A method for fabricating a capacitor, comprising:
forming a lower electrode; forming a nano-composite layer over the lower electrode by mixing X number of different sub-layers, where X is a positive integer greater than approximately 1;
densifying the nano-composite layer; and
forming an upper electrode layer over the nano-composite layer.
Labels: Hynix Semiconductor
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