US Patent 7431970 - Rewritable polymer nanolithography
http://www.freepatentsonline.com/7431970.html
IBM's Millipede system is one of a few designs for using arrays of atomic force microscope tips for nanoscale memory applications. This patent from the Air Force teaches a rewritable version based on thermal heating in which no polymer is removed during tip induced heating and using anneal processes for erasure of data. Claim 1 reads:
1. A polymer nanolithography method, comprising the steps of:
providing an atomic force microscope;
providing a conductive cantilever tip within said atomic force microscope;
providing a thin polymer film mounted upon a conductive wafer;
installing said thin polymer film within said atomic force microscope;
establishing a relative humidity within said atomic force microscope between about 10 to about 70 percent;
setting an initial tip-surface distance by applying a voltage to said cantilever tip such that no mechanical deformation of the surface of said polymer film during scanning occurs; and,
forming nanoscale features upon said polymer by selectively varying said voltage applied to said cantilever tip to effect a desired localized softening of attoliters of said polymer by Joule heating.
IBM's Millipede system is one of a few designs for using arrays of atomic force microscope tips for nanoscale memory applications. This patent from the Air Force teaches a rewritable version based on thermal heating in which no polymer is removed during tip induced heating and using anneal processes for erasure of data. Claim 1 reads:
1. A polymer nanolithography method, comprising the steps of:
providing an atomic force microscope;
providing a conductive cantilever tip within said atomic force microscope;
providing a thin polymer film mounted upon a conductive wafer;
installing said thin polymer film within said atomic force microscope;
establishing a relative humidity within said atomic force microscope between about 10 to about 70 percent;
setting an initial tip-surface distance by applying a voltage to said cantilever tip such that no mechanical deformation of the surface of said polymer film during scanning occurs; and,
forming nanoscale features upon said polymer by selectively varying said voltage applied to said cantilever tip to effect a desired localized softening of attoliters of said polymer by Joule heating.
Labels: Air Force
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