Thursday, May 27, 2010

US Patent 7721347 - Nanotube characterization using RF scanning probe

RF Nano is a company focusing on developing CMOS compatible carbon nanotubes for applications in radio frequency, analog, and mixed signal electronics. This patent discloses a scanning probe device used to characterize the physical and electrical properties of nanotubes. Claim 1 reads:

1. A device for determining an electrical characteristic of a nanotube material without contacting the nanotube material, comprising:

a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material; and

a processor coupled to the scanning probe and configured to determine the electrical characteristic of the nanotube material from the measured reflected signal.