US Patent 7721347 - Nanotube characterization using RF scanning probe
http://www.freepatentsonline.com/7721347.html
RF Nano is a company focusing on developing CMOS compatible carbon nanotubes for applications in radio frequency, analog, and mixed signal electronics. This patent discloses a scanning probe device used to characterize the physical and electrical properties of nanotubes. Claim 1 reads:
1. A device for determining an electrical characteristic of a nanotube material without contacting the nanotube material, comprising:
a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material; and
a processor coupled to the scanning probe and configured to determine the electrical characteristic of the nanotube material from the measured reflected signal.
RF Nano is a company focusing on developing CMOS compatible carbon nanotubes for applications in radio frequency, analog, and mixed signal electronics. This patent discloses a scanning probe device used to characterize the physical and electrical properties of nanotubes. Claim 1 reads:
1. A device for determining an electrical characteristic of a nanotube material without contacting the nanotube material, comprising:
a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material; and
a processor coupled to the scanning probe and configured to determine the electrical characteristic of the nanotube material from the measured reflected signal.
Labels: RF Nano Corporation
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